BMVC 1998 homepage
Title:
Corner Detection via Topographic Analysis of Vector Potential
Authors:

B. Luo, A. D. J. Cross and E. R. Hancock

View:

Paper (PDF, 11 pages, 144K)

DOI:

doi:10.5244/C.12.57

Session:

Low- and High-Level Feature Extraction

Citation:

B. Luo, A. D. J. Cross and E. R. Hancock. Corner Detection via Topographic Analysis of Vector Potential. In Mark Nixon and John Carter, editors, Proceedings of the British Machine Conference, pages 57.1-57.11. BMVA Press, September 1998. doi:10.5244/C.12.57.

BibTeX:

@inproceedings{BMVC.12.57,

   title = {Corner Detection via Topographic Analysis of Vector Potential},

   author = {Luo, B. and Cross, A. D. J. and Hancock, E. R.},

   year = {1998},

   pages = {57.1-57.11},

   booktitle = {Proceedings of the British Machine Vision Conference},

   publisher = {BMVA Press},

   editors = {Nixon, Mark and Carter, John},

   isbn = {1-901725-04-9},

   note = {doi:10.5244/C.12.57}

}

 

@inproceedings{BMVC.12.57:abbreviated,

   title = {Corner Detection via Topographic Analysis of Vector Potential},

   author = {Luo, B. and Cross, A. D. J. and Hancock, E. R.},

   year = {1998},

   pages = {57.1-57.11},

   booktitle = {Proc. BMVC},

   isbn = {1-901725-04-9},

   note = {doi:10.5244/C.12.57}

}