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Authors: |
B. Luo, A. D. J. Cross and E. R. Hancock |
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Paper (PDF, 11 pages, 144K) |
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Session: |
Low- and High-Level Feature Extraction |
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Citation: |
B. Luo, A. D. J. Cross and E. R. Hancock. Corner Detection via Topographic Analysis of Vector Potential. In Mark Nixon and John Carter, editors, Proceedings of the British Machine Conference, pages 57.1-57.11. BMVA Press, September 1998. doi:10.5244/C.12.57. |
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BibTeX: |
@inproceedings{BMVC.12.57, title = {Corner Detection via Topographic Analysis of Vector Potential}, author = {Luo, B. and Cross, A. D. J. and Hancock, E. R.}, year = {1998}, pages = {57.1-57.11}, booktitle = {Proceedings of the British Machine Vision Conference}, publisher = {BMVA Press}, editors = {Nixon, Mark and Carter, John}, isbn = {1-901725-04-9}, note = {doi:10.5244/C.12.57} }
@inproceedings{BMVC.12.57:abbreviated, title = {Corner Detection via Topographic Analysis of Vector Potential}, author = {Luo, B. and Cross, A. D. J. and Hancock, E. R.}, year = {1998}, pages = {57.1-57.11}, booktitle = {Proc. BMVC}, isbn = {1-901725-04-9}, note = {doi:10.5244/C.12.57} }
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